High spatial resolution second-harmonic interferometry
Authors: Conti F., Tiberi M., Giammanco F., Diaspro A., Brandi F.
Autors Affiliation: Dipartimento di Fisica e Fermi, Università Degli Studi di Pisa, Largo B Pontecorvo 3, I-56127 Pisa, Italy; Plasma Diagnostics and Technologies Ltd, via Roma 30, I-56127 Pisa, Italy; Dipartimento di Nanofisica, Istituto Italiano di Tecnologia, Via Morego 30, I-16163 Genova, Italy
Abstract: A monolithic compact fully fiber coupled Nd:YAG (yttrium aluminum garnet) continuous wave laser based second-harmonic interferometer with 60 µm spatial resolution is presented. The device is tested by measuring the dispersion of laser etched polymeric films; the result found is a phase shift sensitivity down to 7 × 10-3 rad for an acquisition time as fast as 300 µs. These results demonstrate the feasibility of high spatial resolution second-harmonic interferometry, and an outlook is given for its use as a novel quantitative phase sensitive imaging technique.
Journal/Review: LASER PHYSICS LETTERS
Volume: 10 (5) Pages from: 056003-1 to: 056003-4
KeyWords: DISPERSION MICROSCOPY; LASER; GENERATIONDOI: 10.1088/1612-2011/10/5/056003