Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems
Authors: Bertasa M., Possenti E., Botteon A., Conti C., Sansonetti A., Fontana R., Striova J., Sali D.
Autors Affiliation: ICVBC-CNR Via Cozzi 53, 2015 Milan, Italy; Dipartimento di Chimica, Università degli Studi di Torino, via Pietro Giuria 7, 10125 Turin, Italy; Dipartimento di Scienze della Terra, Università degli Studi di Milano, Via Botticelli 23, 20133 Milan, Italy; INO-CNR largo E. Fermi 6, Florence, Italy; Bruker Italia S.r.l. Unipersonale, V. le V. Lancetti 43, Milano, Italy
Abstract: This paper is aimed at demonstrating the potentiality of high resolution Attenuated Total Reflection Fourier Transform Infrared micro-mapping (micro-ATR-FTIR) to reconstruct the images of micrometric multi-layered systems. This method can be an effective analytical alternative when the layer thickness requires high lateral resolution, and fluorescence or thermal effects prevent the deployment of conventional analytical techniques such as micro-Raman spectroscopy. This study demonstrates the high microATR- FTIR setup performances in terms of lateral resolution, spectral quality and chemical image contrast using a new laboratory instrument equipped with a single element detector. The method has been first validated on mock-ups and then successfully applied on cross-sectional samples from real artworks: Leonardo da Vinci
Volume: 142 (24) Pages from: 4801 to: 4811
KeyWords: Fourier transform infrared (FTIR) micros; Attenuated Total Reflection (ATR) mappin; chemical imaging; micrometric multi-layers; cultural heritageDOI: 10.1039/c7an00873bCitations: 4data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2019-09-15References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here