Scientific Results

Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems

Year: 2017

Authors: Bertasa M., Possenti E., Botteon A., Conti C., Sansonetti A., Fontana R., Striova J., Sali D.

Autors Affiliation: Consiglio Nazionale Delle Ricerche, Istituto per la Conservazione e la Valorizzazione Dei Beni Culturali, (ICVBC) Via Cozzi 53, I-Milano, 20125, Italy; Dipartimento di Chimica, Università Degli Studi di Torino Via Pietro Giuria 7 10125, Torino, Italy; Dipartimento di Scienze della Terra, Università Degli Studi di Milano, Via Botticelli 23, I-Milano, 20133, Italy; Consiglio Nazionale Delle Ricerche-Istituto Nazionale di Ottica (CNR-INO), Largo E. Fermi 6, Firenze, Italy; Bruker Italia S.r.l. Unipersonale, V. le V. Lancetti 43, I-Milano, 20158, Italy

Abstract: This paper is aimed at demonstrating the potentiality of high resolution Attenuated Total Reflection Fourier Transform Infrared micro-mapping (micro-ATR-FTIR) to reconstruct the images of micrometric multi-layered systems. This method can be an effective analytical alternative when the layer thickness requires high lateral resolution, and fluorescence or thermal effects prevent the deployment of conventional analytical techniques such as micro-Raman spectroscopy. This study demonstrates the high micro-ATR-FTIR setup performances in terms of lateral resolution, spectral quality and chemical image contrast using a new laboratory instrument equipped with a single element detector. The method has been first validated on mock-ups and then successfully applied on cross-sectional samples from real artworks: Leonardo da Vinci

Journal/Review: ANALYST

Volume: 142 (24)      Pages from: 4801  to: 4811

More Information: The authors would like to acknowledge the “Direzione delle Raccolte Artistiche del Castello Sforzesco”, Milan City Council and Italian Ministry of Cultural Heritage.
KeyWords: Fourier transform infrared (FTIR) micros; Attenuated Total Reflection (ATR) mappin; chemical imaging; micrometric multi-layers; cultural heritage
DOI: 10.1039/c7an00873b

Citations: 6
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