Lifetime measurements with the pinhole method in presence of radiation trapping: I-theoretical model

Year: 2012

Authors: Toci G.

Autors Affiliation: CNR – National Research Council of Italy, Istituto di Fisica Applicata Carrara, IFAC-CNR, Via Madonna del Piano 10, 50019 Sesto Fiorentino (FI), Italy

Abstract: This paper reports a new theoretical model for the evaluation of the results of the so-called pinhole method for the measurement of the upper level lifetime in doped optical materials exhibiting radiation trapping effects due to resonant reabsorption of the emitted fluorescence. The model correctly predicts that the fluorescence decay has a double exponential behavior with two time constants, with the shorter one near the intrinsic decay time of the upper level, with a correction depending on the effect of the short range reabsorption. As a consequence, a new method is proposed for the data analysis and the interpretation of the results with respect to the previous literature.

Journal/Review: APPLIED PHYSICS B-LASERS AND OPTICS

Volume: 106 (1)      Pages from: 63  to: 71

More Information: The activity described here has been supported by the project \”CTOTUS-Progetto integrato per lo sviluppo della Capacita Tecnologica e Operativa della Toscana per l\’Utilizzo dello Spazio\” funded by Regione Toscana under the program POR FESR, 2007-2013 Attivita\’ 1.1 Linee d\’intervento D, and by the project IFAC-RSTLCNR (Ricerca spontanea a Tema libero) number 959: \”Nuovi promettenti mezzi attivi drogati ad Ytterbio per laser tunabili nel vicino infrarosso\”.
KeyWords: Decay time; Exponential behaviors; Fluorescence decays; Lifetime measurements; Radiation trapping; Theoretical models; Time constants, Fluorescence, Radiation
DOI: 10.1007/s00340-011-4631-z

Citations: 32
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