Integrated analysis of non-linear loss mechanisms in Yb:YAG ceramics for laser applications

Year: 2012

Authors: Esposito L., Epicier T., Serantoni M., Piancastelli A., Alderighi D., Pirri A., Toci G., Vannini M., Anghel S., Boulon G.

Autors Affiliation: Institute of Science and Technology for Ceramic, National Research Council, Via Granarolo 64, I-48018 Faenza, Italy; University of Lyon, INSA of Lyon, MATEIS UMR CNRS 5510, Bât. B. Pascal, 69621 Villeurbanne, France; Daunia Solar Cell S.r.l., I-47100 Forlì FC, Italy; Institute of Applied Physics Nello Carrara, National Research Council, Via Madonna del Piano 10, 50019 Sesto Fiorentino, Italy; Claude Bernard/Lyon1 University, Physical Chemistry of Luminescent Materials Lab., University of Lyon, UMR CNRS 5620, Bât Kastler, 69622 Villeurbanne, France

Abstract: Transparent 9.8 at% Yb:YAG ceramic samples were prepared by reactive sintering of commercial oxides and using 0 or 1 wt% polyethylene glycol (PEG) as dispersant. The optical quality of the samples turns out to be improved by using a dispersant and optical transmittance close to the commercial samples has been obtained. On the other hand the laser characterization evidenced the activation of a non-linear loss mechanism occurring only in the sample containing PEG and despite its better optical quality, at high excitation level. A SEM analysis of material microstructure could not explain this behavior. A state of the art TEM analysis at nanometric scale was performed providing high resolution chemical spectroscopic results that indicate the presence of amorphous and crystalline silicate phases playing different roles in the two samples. (C) 2012 Elsevier Ltd. All rights reserved.


Volume: 32 (10)      Pages from: 2273  to: 2281

KeyWords: Ceramic samples; Commercial sample; Crystalline silicates; Dispersants; High excitation levels; High resolution; Integrated analysis; Laser characterization; Loss mechanisms; Material microstructures; Nanometric scale; Optical qualities; Reactive sintering; SEM analysis; State of the art; TEM analysis; YAG, Ceramic materials; Electron microscopy; Grain boundaries; Laser excitation; Microstructure; Optical properties; Polyethylene glycols; Silicates; Sintering; Ytterbium, Spectroscopic analysis
DOI: 10.1016/j.jeurceramsoc.2012.02.047

Citations: 31
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