Scientific Results

Structural and electrical properties of nanostructured silicon carbon films

Year: 2010

Authors: Ambrosone G., Basa D.K., Coscia U., Santamaria L., Pinto N., Ficcadenti M., Morresi L., Craglia L., Murri R.

Autors Affiliation: Istituto Nazionale per la Fisica della Materia CNR; Universita degli Studi di Napoli Federico II; Utkal University; Universita degli Studi di Camerino

Conference title: Symposium on Inorganic and Nanostructured Photovoltaics held at the E-MRS 2009 Spring Meeting
Place: Strasbourg, FRANCE

More Information: Pubblicato in: Energy Procedia, Vol. 2 (1), p 3-7
DOI: 10.1016/j.egypro.2010.07.003
WOS:000282010200001
KeyWords: Infrared spectroscopy; Electrical properties; Nanocrystals; Raman spectroscopy;

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