INTEGRATED PHOTONICS Device-level photonic testing
Authors: Burresi M.
Autors Affiliation: Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI),Italy and the European Laboratory for
Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy
Abstract: Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.
Journal/Review: NATURE PHOTONICS
Volume: 9 (1) Pages from: 8 to: 9