Digital Speckle Pattern Interferometry for Applications in Cultural Heritage

Year: 2012

Authors: Pagliarulo V., Arena G., Paturzo M., Finizio A., Ferraro P.

Autors Affiliation: CNR Istituto Nazionale di Ottica

Conference title: XX A.I.VE.LA. National Meeting
Place: CNR – INSEAN Roma

KeyWords: interferometry; Cultural Heritage; diagnostics