Monitoring the thinning dynamics of soap films by phase shift interferometry. The case of perfluoropolyether surfactants

Year: 2014

Authors: Gambi C.M.C., Vannoni M., Sordini A., Molesini G.

Autors Affiliation: University of Florence, Department of Physics and CNISM, via G. Sansone 1, 50019 Sesto Fiorentino (FI), Italy;
European XFEL GmbH, Albert-Einstein-Ring 19, 22767, Hamburg, Germany;
CNR-Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Florence, Italy

Abstract: An interferometric method to monitor the thinning process of vertical soap films from a water solution of surfactant materials is reported. Raw data maps of optical path difference introduced by the film are obtained by conventional phase shift interferometry. Off-line re-processing of such raw data taking into account the layered structure of soap films leads to an accurate measurement of the geometrical thickness. As an example of data acquisition and processing, the measuring chain is demonstrated on perfluoropolyether surfactants; the section profile of vertical films is monitored from drawing to black film state, and quantitative data on the dynamics of the thinning process are presented. The interferometric method proves effective to the task, and lends itself to further investigate the physical properties of soap films.


Volume: 37 (2)      Pages from: 9  to: 9

KeyWords: Accurate measurement; Conventional phase shift; Interferometric methods; Layered Structures; Optical path difference; Perfluoropolyether surfactant; Phase shift interferometry; Surfactant materials, Interferometry; Surface active agents, Films, ether derivative; fluorocarbon; perfluoropolyether; soap, article; chemistry; interferometry, Ethers; Fluorocarbons; Interferometry; Soaps
DOI: 10.1140/epje/i2014-14009-2

Citations: 2
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