Scientific Results

Does interferometer monitor thickness or optical-path variations?

Year: 1998

Authors: Ferraro P.

Autors Affiliation: IPSIA

Journal/Review:

Volume: 36 (4)      Pages from: 198  to: 198

KeyWords: light interferometers; glass; thickness measurement; refractive index; thermal expansion
DOI: 10.1119/1.880036

gdpr-image
This site uses cookies. If you decide to continue browsing we consider that you accept their use. For more information about cookies and how to delete them please read our Info Policy on cookies use.
Read more