Optical control of surface finish
Authors: Fontani D., Francini F., Longobardi G., Sansoni P.
Autors Affiliation: CEO Centro di Eccellenza Optronica, Largo E. Fermi 6, 50125 Firenze, Italy;
Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy
Abstract: Measurement of surface roughness on mechanical components, which may incorporate also critical profiles, using diffused light techniques is a very complex problem. This paper describes a new optoelectronic device employing a diode laser and an array of discrete photodetectors placed on an arc of circle and interfaced with a data acquisition board. The device allows an extended range of roughness measurements; it is compact, easy to be used and almost insensitive to external noise and vibrations. It provides an estimation of the surface quality parameters comparing the scattered light at two different ranges of angles thereby overcoming many of the earlier limitations. The experiment has evidenced that there is a good agreement between measurement results and theoretical model usually applicable to normally distributed surfaces. (C) 2000 Elsevier Science Ltd. All rights reserved.
Journal/Review: OPTICS AND LASERS IN ENGINEERING
Volume: 32 (5) Pages from: 459 to: 472
More Information: This work has been partially supported by the European Community within a European Project BRPR-CT97 0372 named SMARTMEC started in January 1997 and still in progress.KeyWords: Data acquisition; Light scattering; Mathematical models; Photodetectors; Roughness measurement; Semiconductor lasers, Data acquisition board; Surface finish; Surface quality, Optoelectronic devicesDOI: 10.1016/S0143-8166(00)00014-2Citations: 8data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2023-05-28References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here