Defect detection in textured materials by optical filtering with structured detectors and self-adaptable masks
Authors: Ciamberlini C., Francini F., Longobardi G., Sansoni P., Tiribilli B.
Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy;
Centro di Eccellenza Optronica, Campi Bisenzio 500013 Firenze, Italy
Abstract: An optical method using Fourier transformation and spatial filtering is used to reveal defects in textured materials in real time. New optical structured filter types were developed including a self-adaptable mask made of photochromic polymers. The characteristics of these materials make possible very promising applications in pattern recognition such as that represented by a fabric. (C) 1996 Society of Photo-Optical Instrumentation Engineers.
Journal/Review: OPTICAL ENGINEERING
Volume: 35 (3) Pages from: 838 to: 844
KeyWords: Filter; Fourier transform; Mask; Pattern recognition; TextureDOI: 10.1117/1.600663Citations: 28data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2023-06-04References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here