Defect detection in textured materials by optical filtering with structured detectors and self-adaptable masks

Year: 1996

Authors: Ciamberlini C., Francini F., Longobardi G., Sansoni P., Tiribilli B.

Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy;
Centro di Eccellenza Optronica, Campi Bisenzio 500013 Firenze, Italy

Abstract: An optical method using Fourier transformation and spatial filtering is used to reveal defects in textured materials in real time. New optical structured filter types were developed including a self-adaptable mask made of photochromic polymers. The characteristics of these materials make possible very promising applications in pattern recognition such as that represented by a fabric. (C) 1996 Society of Photo-Optical Instrumentation Engineers.

Journal/Review: OPTICAL ENGINEERING

Volume: 35 (3)      Pages from: 838  to: 844

KeyWords: Filter; Fourier transform; Mask; Pattern recognition; Texture
DOI: 10.1117/1.600663

Citations: 28
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