Scientific Results

Signal processing and calibration procedures for in situ diode-laser absorption spectroscopy

Year: 2004

Authors: Werle P., Mazzinghi P., D’Amato F., De Rosa M., Maurer K., Slemr F.

Autors Affiliation: Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy;
Institute for Metrology and Climate Research, 82467 Garmisch-Partenkirchen, Germany;
Max-Planck Institute for Chemistry, Atmosferic Chemistry Department, 55128 Mainz, Germany

Abstract: Gas analyzers based on tunable diode-laser spectroscopy (TDLS) provide high sensitivity, fast response and highly specific in situ measurements of several atmospheric trace gases simultaneously. Under optimum conditions even a shot noise limited performance can be obtained. For field applications outside the laboratory practical limitations are important. At ambient mixing ratios below a few parts-per-billion spectrometers become more and more sensitive towards noise, interference, drift effects and background changes associated with low level signals. It is the purpose of this review to address some of the problems which are encountered at these low levels and to describe a signal processing strategy for trace gas monitoring and a concept for in situ system calibration applicable for tunable diode-laser spectroscopy. To meet the requirement of quality assurance for field measurements and monitoring applications, procedures to check the linearity according to International Standard Organization regulations are described and some measurements of calibration functions are presented and discussed. (C) 2003 Elsevier B.V. All rights reserved.


Volume: 60 (8-9)      Pages from: 1685  to: 1705

KeyWords: Atmospherics; Calibration; Computer control; Gravimetric analysis; Natural frequencies; Optimization; Problem solving; Quality assurance; Semiconductor lasers; Signal interference; Signal processing; Spectrometers; Troposphere, Calibration functions; Gas analysis; Permeation devices, Absorption spectroscopy, air pollutant; Atmosphere; Spectroscopy; Statistics, Air Pollutants; Atmosphere; Gases; Lasers; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Spectrum Analysis
DOI: 10.1016/j.saa.2003.10.013

Citations: 102
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