Frequency- and intensity-noise measurements of a widely tunable 2-mu m Tm-Ho : KYF laser

Year: 2006

Authors: Galzerano G., Sani E., Toncelli A., Tonelli M., Svelto C., Laporta P.

Autors Affiliation: Istituto di Fotonica e Nanotecnologie—Consiglio Nazionale delle Ricerche (IFN-CNR), Dipartimento di Fisica—Politecnico di Milano, 20133 Milan, Italy;
National Enterprise for Nanoscienze and Nanotechnology-INFM (NEST-INFM), Dipartimento di Fisica, Università di Pisa, 56100 Pisa, Italy;
Dipartimento di Elettronica e Informazione del Politecnico
di Milano and L’Istituto di Elettronica e di Ingegneria dell’Informazione
e delle Telecomunicazioni-CNR (IEIIT-CNR) and INFM, 20133 Milan, Italy

Abstract: The measurement of the frequency and intensity noise in a novel single-mode 2-μm Tm–Ho:KYF laser is presented. The laser frequency noise is measured by exploiting the
fringe side of the transmission of a Fabry–Pérot interferometer. The measured power spectral density of the frequency noise is principally characterized by a random-walk noise contribution, which sets an emission linewidth of ∼ 600 kHz for the 2-μm radiation. The relative intensity noise (RIN) reaches the quantum limit of −155 dB/Hz for Fourier frequencies above 1 MHz and shows a maximum level of −90 dB/Hz at the relaxation-oscillation frequency of 20 kHz.

Journal/Review: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

Volume: 55 (1)      Pages from: 128  to: 131

KeyWords: Characterization; Fabry-Perot interferometers; Oscillations; Oscillators (electronic); Semiconductor lasers; Solid state lasers, Diode-pumped laser; Frequency-noise measurement; Intensity-noise measurement; Tunable laser, Laser resonators
DOI: 10.1109/TIM.2005.861261

Citations: 5
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