Refractive index of Lithosil and Suprasil 312 at cryogenic temperature
Authors: Vannoni M., Olivieri M., Mondello G., Sordini A., Molesini G.
Autors Affiliation: CNR-Istituto Nazionale di Ottica, Firenze; Galileo Avionica, Campi Bisenzio
Abstract: Measurements of the refractive index of two different Lithosil samples and a sample of Suprasil 312 at cryogenic temperature and at 293 K are reported for the spectral range from 480 nm to 894 nm. Such data are useful for the design of fused silica optical components and systems destined for space missions.
Volume: 47 (3) Pages from: 175 to: 178
KeyWords: Optical metrology; refractive index; cryogenic measurementsDOI: 10.1088/0026-1394/47/3/008Citations: 1data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2020-02-23References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here