Refractive index of Lithosil and Suprasil 312 at cryogenic temperature

Year: 2010

Authors: Vannoni M., Olivieri M., Mondello G., Sordini A., Molesini G.

Autors Affiliation: CNR-Istituto Nazionale di Ottica, Firenze; Galileo Avionica, Campi Bisenzio

Abstract: Measurements of the refractive index of two different Lithosil samples and a sample of Suprasil 312 at cryogenic temperature and at 293 K are reported for the spectral range from 480 nm to 894 nm. Such data are useful for the design of fused silica optical components and systems destined for space missions.

Journal/Review: METROLOGIA

Volume: 47 (3)      Pages from: 175  to: 178

KeyWords: Optical metrology; refractive index; cryogenic measurements
DOI: 10.1088/0026-1394/47/3/008

Citations: 1
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