Novel x-ray multispectral imaging of ultraintense laser plasmas by a single-photon charge coupled device based pinhole camera

Year: 2007

Authors: Labate L., Giulietti A., Giulietti D., Koester P., Levato T., Gizzi LA., Zamponi F., Luebcke A., Kaempfer T., Uschmann I., Foerster E.

Autors Affiliation: Intense Laser Irradiation Laboratory, IPCF, Consiglio Nazionale Delle Ricerche, Via Moruzzi 1, 56124 Pisa, Italy; Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, Max-Wien-Platz 1, 07743 Jena, Germany; IINFN, Sezione di Pisa, Italy; Dipartimento di Fisica, Universita di Pisa, Sezione di Pisa, Italy

Abstract: Spectrally resolved two-dimensional imaging of ultrashort laser-produced plasmas is described, obtained by means of an advanced technique. The technique has been tested with microplasmas produced by ultrashort relativistic laser pulses. The technique is based on the use of a pinhole camera equipped with a charge coupled device detector operating in the single-photon regime. The spectral resolution is about 150 eV in the 4-10 keV range, and images in any selected photon energy range have a spatial resolution of 5 mu m. The potential of the technique to study fast electron propagation in ultraintense laser interaction with multilayer targets is discussed and some preliminary results are shown.


Volume: 78 (10)      Pages from: 103506-1  to: 103506-6

More Information: We acknowledge the Deutsche Forschungsgemeinschaft for the (financial) support. Access to the Jena facility was granted by the LASERLAB initiative of the 6th Framework Programme of the European Union. The Pisa authors wish to acknowledge support from the Italian MIUR projects FISR “Impianti innovativi multiscopo per la produzione di radiazione X ed ultravioletta,” FIRB “BLISS (Broadband Laser for ICF Strategic Studies),” and “SPARX.” The Pisa group also acknowledge support from the INFN project “PLASMONX (Plasma Acceleration and Monochromatic X-ray generation).”
KeyWords: fast electrons; dense matter; high-energy K-alpha; detectors; spectroscopy
DOI: 10.1063/1.2800774

Citations: 24
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