Scientific Results

Indagini riflettografiche di sette miniature su avorio con scanner IR-colore ad alta risoluzione

Year: 2005

Authors: Daffara C.

Autors Affiliation: INOA – Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze

Journal/Review:

KeyWords: diagnostica non invasiva

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