A Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals
Authors: De Nicola S., Ferraro P., Finizio A., De Natale P., Grilli S., Pierattini G.
Autors Affiliation: Istituto di Cibernetica del CNR “Edoardo Caianiello”, Compr. “A. Olivetti”, Fabbr. 70, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
Istituto Nazionale di Ottica Applicata, Sez. di Napoli c/o Istituto di Cibernetica del CNR “Edoardo Caianiello”, Compr. “A. Olivetti”, Fabbr. 70, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy
Abstract: We report a new interferometric technique for measuring the ordinary and extraordinary refractive indices of uniaxial crystals. The technique is based on the measurement of the rotation-dependent phase changes of the optical path length in crystal plates. Accurate measurement of the phase shift as a function of the rotation of the sample is achieved by using a fast-Fourier-transform based fringe analysis method for phase retrieval. The principle of the method is discussed and measurements of the ordinary and extraordinary refractive indices of a lithium niobate crystal are reported. (C) 2002 Elsevier Science B.V. All rights reserved.
Journal/Review: OPTICS COMMUNICATIONS (PRINT)
Volume: 202 (1-3) Pages from: 9 to: 15
KeyWords: Crystals; Fast Fourier transforms; Lithium niobate; Moire fringes; Phase shift; Refractive index, Uniaxial crystals, InterferometryDOI: 10.1016/S0030-4018(01)01719-9Citations: 13data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2020-11-22References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here