Phase-shifting point-diffraction interferometer developed by using the electro-optic effect in ferroelectric crystals

Year: 2006

Authors: Paturzo M., Pignatiello F., Grilli S., De Nicola S., Ferraro P.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata and LENS European Laboratory for Non-Linear Spectroscopy, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy

Abstract: A novel and simple phase-shifting point-diffraction interferometer using a z-cut lithium niobate wafer is proposed. The pinhole is realized by an optical lithography process, aluminum deposition, and subsequent liftoff on the surface of the wafer. The phase shifting is obtained by inducing the electro-optic effect along the z crystal axis. We demonstrate experimentally the possibility of retrieving an aberrated wavefront. (c) 2006 Optical Society of America.

Journal/Review: OPTICS LETTERS

Volume: 31 (24)      Pages from: 3597  to: 3599

KeyWords: interferometry; metrology; phase measurement
DOI: 10.1364/OL.31.003597

Citations: 17
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