Scientific Results

AFM imaging of resin embedded thin section after moderate chemical etching

Year: 2003

Authors: Tiribilli B., Bani D., Vassalli M., Quercioli F., Ghirelli A.

Autors Affiliation: Tipologia: Comunicazioni/relazioni in Convegni internazionali
Istituto Nazionale di Ottica Applicata – Lab. di Biofotonica, Largo E. Fermi 6, 50125 Firenze, Italy;
Dip. di Anatomia, Istologia, Medicina legale, Università di Firenze, Italy

Conference title: Proceedings 6th Multinational Congress on Microscopy – European Extension
Place: Pula, Croatia

KeyWords: Atomic force microscopy

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