Scientific Results

Misure di parallelismo con metodi meccanici e interferometrici

Year: 2007

Authors: Vannoni M., Bertozzi R.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Centro SIT n. 130, Largo E. Fermi 6, 50125 Firenze, Italy;
CERMRT Centro SIT n. 52,

Conference title: Metrologia & Qualità
Place: Torino

KeyWords: metrology

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