Scientific Results

Misure di parallelismo con metodi meccanici e interferometrici

Year: 2007

Authors: Vannoni M., Bertozzi R.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Centro SIT n. 130, Largo E. Fermi 6, 50125 Firenze, Italy;
CERMRT Centro SIT n. 52,

Conference title: Metrologia & Qualità
Place: Torino

KeyWords: metrology

gdpr-image
This site uses cookies. If you decide to continue browsing we consider that you accept their use. For more information about cookies and how to delete them please read our Info Policy on cookies use.
Read more