Scientific Results

New approaches towards nanometre accuracy in absolute planarity measurements

Year: 2007

Authors: Vannoni M., Molesini G.

Autors Affiliation: CNR-Istituto Nazionale di Ottica Applicata

Journal/Review:

KeyWords: optical testing; metrology; absolute planarity

gdpr-image
This site uses cookies. If you decide to continue browsing we consider that you accept their use. For more information about cookies and how to delete them please read our Info Policy on cookies use.
Read more