Time of flight laser scanner for architectural and archaeological applications
Authors: Fontana R., Gambino M.C., Gianfrate G., Greco M., Marras L., Materazzi M., Pampaloni E., Pezzati L.
Autors Affiliation: Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy; Università degli Studi di Lecce, Dip. Ing. dell’Innovazione, via per Arnesano, 73100 Lecce, Italy.
Abstract: The realization of an accurate 3D model of a building, a piece of architecture or a terrain has been a prerogative of the photogrammetric systems for a long time. However, recent developments in opto-electronic technology and 3D analysis software made the production of 3D models by laser scanning a practical proposition. The main advantages of laser
scanners are accuracy and speed, allowing, thus, the collecting of data on a dense sampling of the object. For many architectural and industrial applications it is important to integrate the data acquired with different instruments, but a problem met with many commercial systems is the lack of compatibility with classic survey methodologies. Moreover, superimposition of results from different techniques is possible only if the output is metrically correct. This work is aimed at showing the results of some architectural and archaeological surveys realized by means of a 3D scanning device, based on the Time-Of-Flight (TOF) technology. The instrument, devoted to architectural applications in the Cultural Heritage field, was set up in order to provide the characteristics of reliability and compatibility to other systems. Such a device is composed by a high precision scanning system equipped with a commercial low-cost distance-meter.
Journal/Review: PROCEEDINGS OF SPIE
Volume: 5146 Pages from: 185 to: 193
KeyWords: TOF; laser scanner; architectural survey; 3D relief; 3D modelDOI: 10.1117/12.501250Citations: 4data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2020-07-05References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here