Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography

Year: 2007

Authors: Ferraro P., Miccio L., Grilli S., Paturzo M., De Nicola S., Finizio A., Osellame R., Laporta P.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
European Laboratory for non-linear spectroscopy (LENS), Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy
Istituto di Cibernetica del CNR “E. Caianiello”, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
Istituto di Fotonica e Nanotecnologie del CNR – Dipartimento di Fisica del Politecnico di Milano, Piazza L. da Vinci 32, 20133 Milano, Italy

Abstract: Quantitative Phase Microscopy (QPM) by interferometric techniques can require a multiwavelength configuration to remove 2 pi ambiguity and improve accuracy. However, severe chromatic aberration can affect the resulting phase-contrast map. By means of classical interference microscope configuration it is quite unpractical to correct such aberration. We propose and demonstrate that by Digital Holography (DH) in a microscope configuration it is possible to clear out the QPM map from the chromatic aberration in a simpler and more effective way with respect to other approaches. The proposed method takes benefit of the unique feature of DH to record in a plane out-of-focus and subsequently reconstruct numerically at the right focal image plane. In fact, the main effect of the chromatic aberration is to shift differently the correct focal image plane at each wavelength and this can be readily compensated by adjusting the corresponding reconstruction distance for each wavelength. A procedure is described in order to determine easily the relative focal shift among different imaging wavelengths by performing a scanning of the numerical reconstruction along the optical axis, to find out the focus and to remove at the same time the chromatic aberration. (C) 2007 Optical Society of America.

Journal/Review: OPTICS EXPRESS

Volume: 15 (22)      Pages from: 14591  to: 14600

KeyWords: Holographic Interferometry; Optical Data Processing; Aberration Compensation
DOI: 10.1364/OE.15.014591

Citations: 98
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