Scientific Results

Measuring the deformations of a scattering surface with a general purpose interferometer

Year: 1996

Authors: Trivi M., Greco V., Hoffer L., Molesini G.

Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy

Abstract: The present work demonstrates the use of a general purpose interferometer to measure the deformations of a scattering surface by processing speckle patterns instead of smooth wavefronts. The operation of the interferometer are re- programmed to include algorithms adapted to handling speckle patterns. Details of the measuring operation are described, limits of applicability are discussed, and experimental results are presented. ©2004 Copyright SPIE – The International Society for Optical Engineering.

Conference title:

KeyWords: General purpose; Scattering surface; Speckle patterns, Deformation; Optical testing; Speckle; Interferometers; Non destructive testing

This site uses cookies. If you decide to continue browsing we consider that you accept their use. For more information about cookies and how to delete them please read our Info Policy on cookies use.
Read more