Scanning aspherical surfaces with the focus-wavelength encoded profilometer
Authors: Francini F., Molesini G., Quercioli F., Tiribilli B.
Autors Affiliation: Istituto Nazionale di Ottica, Largo Enrico Fermi, Firenze, 50125, Italy
Abstract: New developments with the focus-wavelength encoded optical profilometer are reported in the area of applications to surface contouring. Longitudinal chromatic dispersion of a suitably designed lens as a probe is exploited to obtain distance information between the probe and the surface. After proper scanning, the surface topography is recovered.
KeyWords: Optical instruments; Surface, contour measurement; Aspherical surfaces; Chromatic dispersion; Focus-wavelength encoding; Optical profilometer; Surface topography, optical systemsDOI: 10.1117/12.964477