THz time-domain spectroscopic investigations of thin films
Authors: Taschin A., Bartolini P., Tasseva J., Torre R.
Autors Affiliation: Univ Firenze, European Lab Nonlinear Spect LENS, Via N Carrara 1, I-50019 Florence, Italy; Complesso Univ MS Angelo, Sez Napoli, INFN, Ed 6,Via Cintia, I-80126 Naples, Italy; CNR, INO, Via Campi Flegrei 34, I-80078 Pozzuoli, Italy; Univ Firenze, Dip Fis & Astron, Via Sansone 1, I-50019 Florence, Italy
Abstract: THz time domain spectroscopy is a powerful technique enabling the investigation of different materials in the far-infrared frequency range. Even if nowadays this technique is well established, its application to very thin films remains particularly difficult. We investigated the utilization of THz spectroscopy on samples of micrometric thickness with the aim to disentangle multiple reflections and to measure with high accuracy the absolute values of the material parameters. We implemented an experimental and data analysis procedure that can be applied to free-standing single-layers or multi-layers samples.
Specifically, we report on the experimental investigation by THz time domain spectroscopy of two samples: a test sample made of two layers of known thickness and materials; and a second sample, that is of a great interest for cultural heritage studies, made of a thin film of ink layered on a thicker support. Moreover, we describe in details the data analysis and fitting procedures needed to extract the material parameters from the experimental results. (C) 2017 Elsevier Ltd. All rights reserved.
Volume: 118 Pages from: 282 to: 288
KeyWords: TERAHERTZ; REFLECTOMETRYDOI: 10.1016/j.measurement.2017.05.074Citations: 20data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2022-05-15References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here