Measurement of refractive index by double-exposure speckle pattern recording

Year: 1989

Authors: Buah-Bassuah P.K., Francini F., Molesini G.

Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy

Abstract: An experimental approach is presented to the measurement of the refractive index of materials based on the optical properties of speckle patterns. The sample being characterized is shaped in the form of a plane parallel plate and so inserted in a speckle-forming beam. Speckles are recorded on a photographic plate with a double-exposure technique producing a twin speckle pattern. Decoding of such a recorded pattern leads to the desired information.

Journal/Review: AMERICAN JOURNAL OF PHYSICS

Volume: 57 (4)      Pages from: 366  to: 370

KeyWords: refractive index; speckles; optical metrology
DOI: 10.1119/1.16023

Citations: 2
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