Measurement of refractive index by double-exposure speckle pattern recording
Authors: Buah-Bassuah P.K., Francini F., Molesini G.
Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy
Abstract: An experimental approach is presented to the measurement of the refractive index of materials based on the optical properties of speckle patterns. The sample being characterized is shaped in the form of a plane parallel plate and so inserted in a speckle-forming beam. Speckles are recorded on a photographic plate with a double-exposure technique producing a twin speckle pattern. Decoding of such a recorded pattern leads to the desired information.
Journal/Review: AMERICAN JOURNAL OF PHYSICS
Volume: 57 (4) Pages from: 366 to: 370
KeyWords: refractive index; speckles; optical metrologyDOI: 10.1119/1.16023Citations: 2data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2023-05-28References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here