Time-Resolved Studies of the C-A Transition in Avalanche Discharges: Fluorescence and Gain-Loss Studies

Year: 1991

Authors: Sze R.C., Sakai T., Vannini M., Sentis M.L.

Autors Affiliation: Los Alamos National Laboratory, Los Alamos, NM 87545, United States; Rice University, Keio University, Keio Houston, TX 77001, United States; Instituto di Elletronica Quantistica, Florence, Italy; Institut de Mecanique des Fluides, Marseille, France

Abstract: Time-resolved XeF C-A fluorescence and gain-loss studies are conducted in an avalanche discharge using arc-type UV preionization in a variety of devices that deliver peak powers from 1 to 13 MW/cm3 in time intervals from 10 to 30 ns. The results coupled with extensive fluorescence measurements give indications about the possibility of developing a successful XeF C-A transition avalanche discharge laser.

Journal/Review: IEEE JOURNAL OF QUANTUM ELECTRONICS

Volume: 27 (1)      Pages from: 77  to: 89

More Information: Los Alamos National Laboratory, LANL. IEEE Foundation, IEEE. Keio University, Keio. Rice University, TX 77001. Los Alamos National Laboratory, LANL. Los Alamos National Laboratory, LANL. – Manuscript received September 21, 1989; revised August 27, 1990. This work was supported by internal funding from the Los Alamos National Laboratory. R. C. Sze is with Los Alamos National Laboratory, Los Alamos, NM 87545. T. Sakai is with Rice University, Houston, TX 77001 and Keio University, Keio, Japan. M. Vannini is with the Instituto di Elletronica Quantistica, Florence, Italy. M. Sentis is with the Institut de MCcanique des Fluides, Marseille, France. IEEE Log Number 9041005.
KeyWords: Electric Discharges; Fluorescence; Ultraviolet Radiation, Avalanche Discharges; Time-Resolved Analysis; Xenon Fluoride, Lasers, Gas
DOI: 10.1109/3.73544

Citations: 2
data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-04-21
References taken from IsiWeb of Knowledge: (subscribers only)
Connecting to view paper tab on IsiWeb: Click here
Connecting to view citations from IsiWeb: Click here