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Author: Ascoli C 

1) Scanning Ion Conductance Microscopy—Morphology and Mechanics
By: Tognoni E., Baschieri P., Dinelli F., Ascoli C., Pellegrino M. Year: 2018 (Cit.: 0)

2) Characterization of tip size and geometry of the pipettes used in Scanning Ion Conductance Microscopy in MICRON
By: Tognoni E., Baschieri P., Ascoli C., Pellegrini M., Pellegrino M. Year: 2016 (Cit.: 7 DOI: 10.1016/j.micron.2016.01.002)

3) Evanescent waves in the visible range
By: Ascoli C., Allegrini M. Year: 2014 (Cit.: 0)

4) Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth
By: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Ascoli C., Baschieri P., Dinelli F., Year: 2013 (Cit.: 0 DOI: 10.1117/12.2021541)

5) Measuring the elastic properties of living cells through the analysis of current-displacement curves in scanning ion conductance microscopy in PFLUGERS ARCHIV-EUROPEAN JOURNAL OF PHYSIOLOGY
By: Pellegrino M., Pellegrini M., Orsini P., Tognoni E., Ascoli C., Baschieri P., Dinelli F. Year: 2012 (Cit.: 16 DOI: 10.1007/s00424-012-1127-6)

6) Integrated SICM-AFM-optical microscope to measure forces due to hydrostatic pressure applied to a pipette in MICRO & NANO LETTERS
By: Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2012 (Cit.: 11 DOI: 10.1049/mnl.2011.0670)

7) Comment on “The long range voice coil atomic force microscope” [Rev. Sci. Instrum. 83, 023705 (2012)] in REVIEW OF SCIENTIFIC INSTRUMENTS
By: Mariani T., Ascoli C. Year: 2012 (Cit.: 1 DOI: 10.1063/1.4752146)

8) Weak hydrostatic forces in far-scanning ion conductance microscopy used to guide neuronal growth cones in NEUROSCIENCE RESEARCH
By: Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2011 (Cit.: 25 DOI: 10.1016/j.neures.2010.11.009)

9) Strategies to measure the Young modulus of cells by means of Scanning Ion Conductance Microscopy
By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 (Cit.: 0)

10) Use of scanning ion conductance microscopy to map elastic properties of cell membranes
By: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 (Cit.: 0 DOI: 10.1109/IWBP.2011.5954800)

11) Use of scanning ion conductance microscopy to map
elastic properties of cell membranes

By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 (Cit.: 0)

12) Scanning electro-optic microscopy of ferroelectric domain structure with a near-field fiber probe in JOURNAL OF APPLIED PHYSICS
By: Tikhomirov O., Labardi M., Ascoli C., Allegrini M. Year: 2011 (Cit.: 1 DOI: 10.1063/1.3656731)

13) Una sonda ibrida AFM/SNOM integrata in fibra ottica
By: Tiribilli B., Margheri G., Baschieri P., Ascoli C., Menozzi C., Chavan D., Iannuzzi D. Year: 2010 (Cit.: 0)

14) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica utilizzata per la guida dei coni di crescita neuronali
By: Pellegrini M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2010 (Cit.: 0)

15) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica
By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2010 (Cit.: 0)

16) Monitoring of an atomic force microscope cantilever with a compact disk pickup in REVIEW OF SCIENTIFIC INSTRUMENTS
By: Quercioli F., Tiribilli B., Ascoli C., Baschieri P., Frediani C. Year: 1999 (Cit.: 36 DOI: 10.1063/1.1149969)

17) Measuring topography and refractive index of channel waveguides with a hybrid AFM-SNOM in JOURNAL OF LIGHTWAVE TECHNOLOGY
By: Mannoni A., Quercioli F., Tiribilli B., Ascoli C., Baschieri P., Frediani C. Year: 1998 (Cit.: 8 DOI: 10.1109/50.661365)

18) A Scanning Force Milliscope
By: Mariani T., Baschieri P., Frediani C., Ascoli C.
Year: 1998 (Cit.: 0)

19) Simultaneous force ad optical tunneling microscopy with 3-D interaction mapping using SI3N4 probes
By: Mannoni S., Ascoli C., Baschieri P., Frediani C., Quercioli F., Tiribilli B. Year: 1996 (Cit.: 0)

20) Scanning probe microscope with interchangeable AFM-FFM and STM heads in IL NUOVO CIMENTO D
By: Allegrini M., Arpa E., Ascoli C., Baschieri P., Dinelli F., Frediani C., Labardi M., Lio A., Mariani T., Vanni L. Year: 1993 (Cit.: 0 DOI: 10.1007/BF02456911)

English