Proceedings of SPIE – The International Society for Optical Engineering: Introduction
Year: 2005
Authors: Ottevaere H., DeWolf P., Wiersma D.S.
Autors Affiliation: Vrije Univ Brussel; Dipartimento di Fisica, Universitá di Firenze, I-50019 Sesto-Fiorentino (FI), Italy; INFM-MATIS, European Laboratory for Non-linear Spectroscopy, Sesto Fiorentino (Florence), Italy
Abstract: [No abstract available]
Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
KeyWords: metrologyDOI: 10000000000