Coherent backscattering of Raman light
Year: 2017
Authors: Fazio B., Irrera A., Pirotta S., D\’Andrea C., Del Sorbo S., Josč Lo Faro M., Gucciardi P.G., Iatģ M.A., Saija R., Patrini M., Musumeci P., Salvatore Vasi C., Wiersma D.S., Galli M., Priolo F.
Autors Affiliation: CNR-IPCF, viale F. Stagno d\’Alcontres 37, Faro-Superiore-Messina, 98158, Italy; Dipartimento di Fisica, Universitą degli Studi di Pavia, via Bassi 6, Pavia, 27100, Italy; MATIS IMM-CNR, via S. Sofia, 64, Catania, 95123, Italy; CSFNSM, Viale A. Doria, 6, Catania, 95125, Italy; LENS, Universitą di Firenze, via Nello Carrara, 1, Sesto Fiorentino, Firenze, 50019, Italy; Dipartimento di Fisica e Astronomia, Largo Enrico Fermi, 2, Firenze, 50125, Italy; INRIM-Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, Torino, 10135, Italy; Scuola Superiore di Catania, Universitą di Catania, via Valdisavoia, 9, Catania, 95123, Italy; CNR-IFAC, via Madonna del Piano 10, Sesto Fiorentino, Firenze, I-50019, Italy
Abstract: Coherent backscattering of light is observed when electromagnetic waves undergo multiple scattering within a disordered optical medium. So far, coherent backscattering of light has been studied extensively for elastic (or Rayleigh) light scattering. The occurrence of inelastic scattering affects the visibility of the backscattering effect by reducing the degree of optical coherence in the diffusion process. Here, we discuss the first experimental observation of a constructive interference effect in the inelastically backscattered Raman radiation from strongly diffusing silicon nanowire random media. The observed phenomenon originates from the coherent nature of the Raman scattering process, which typically occurs on a scale given by the phonon coherence length. We interpret our results in the context of a theoretical model of mixed Rayleigh-Raman random walks to shed light on the role of phase coherence in multiple scattering phenomena.
Journal/Review: NATURE PHOTONICS
Volume: 11 (3) Pages from: 170 to: 176
KeyWords: Backscattering; Electromagnetic waves; Inelastic scattering; Light scattering; Multiple scattering; Random processes, Coherence lengths; Coherent backscattering; Constructive interference; Diffusion process; Phase coherence; Scattering process; Silicon nanowires; Theoretical modeling, Coherent scatteringDOI: 10.1038/NPHOTON.2016.278Citations: 36data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-10-27References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here