From linear to cubic nonlinear imaging effects in multimode waveguides

Year: 2005

Authors: Modotto D., De Angelis C., Magana-Cervantes M.A., De La Rue R.M., Morandotti R., Linden S., Van Driel H.M., Aitchison J.S.

Autors Affiliation: Istituto Nazionale per la Fisica della Materia, Dipartimento di Elettronica per l’Automazione, Universita` di Brescia,
via Branze 38, Brescia 25123, Italy; Department of Electronics and Electrical Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, Glasgow G12 8LT, Scotland, UK; Institut National de la Recherche Scientifique, Universite´ du Quebec, Varennes J3X 1S2, Canada; Department of Physics, University of Toronto, Toronto M5S 1A7, Canada;
The Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, 10 King’s College Road, Toronto M5S 3G4, Canada

Abstract: We have investigated experimentally the linear and cubic nonlinear properties of multimode waveguides fabricated on AlGaAs wafers. By varying the input beam position or angle of incidence, the multipeak intensity profiles observed at the waveguide output unveil clearly the multimode nature of the waveguide. Because of the large Kerr nonlinearity of the semiconductor, the field evolution inside the waveguides depends on the launched intensity. Numerical simulations have confirmed the experimental findings and an analytical model, based on the nonlinear interaction between the modes of the dielectric structure, explains the device behavior and clarifies the role of the injected beam parameters. (c) 2005 Optical Society of America.

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

Volume: 22 (4)      Pages from: 870  to: 877

KeyWords: Nonlinear Optics
DOI: 10.1364/JOSAB.22.000870

Citations: 2
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