Real time analysis of diffraction patterns, at extremely low-light levels

Year: 1994

Authors: Ciamberlini C., Longobardi G.

Autors Affiliation: Istituto Nazionale di Ottica, Largo E. Fermi 6, 50125 Firenze, Italy

Abstract: By analyzing previous experiments with statistically independents photons, just one concerns the diffraction pattern; it was revealed with photographic technique. The present describes an experiment which produces a diffraction pattern at very low intensity radiation consisting of statistically independent photons. This pattern was revealed in real time by using image intensification. Several photodetection arrangements utilizing image intensifier tubes and image storage devices have been tested and the results presented. This study involved the evaluation of the error probability in photons overlap at any rims. The linearity dependence between light intensity and bright pattern diffraction was verified.

Journal/Review: OPTICS AND LASERS IN ENGINEERING

Volume: 21 (5)      Pages from: 317  to: 325

KeyWords: Errors; Image intensifiers (electron tube); Image processing; Light; Light interference; Photography; Photons; Probability, Image intensification; Light diffraction patterns; Light intensity; Real time analysis; Statistically independent photons, Electromagnetic wave diffraction
DOI: 10.1016/0143-8166(94)90051-5

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