Frequency metrology and precision spectroscopy in the infrared

Year: 2002

Authors: De Natale P., Borri S., Cancio P., Giusfredi G., Mazzotti D.

Autors Affiliation: Istituto Nazionale di Ottica Applicata (INOA)

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

KeyWords: frequency metrology; infared spectroscopy;