Digital Speckle Pattern Interferometry for Applications in Cultural Heritage
Year: 2012
Authors: Pagliarulo V., Arena G., Paturzo M., Finizio A., Ferraro P.
Autors Affiliation: CNR Istituto Nazionale di Ottica
Conference title: XX A.I.VE.LA. National Meeting
Place: CNR – INSEAN Roma
KeyWords: interferometry; Cultural Heritage; diagnostics