Near-field short range correlation in optical waves transmitted through random media

Year: 2003

Authors: Emiliani V., Intonti F., Cazayous M., Wiersma D., Colocci M., Aliev F., Lagendijk A.

Autors Affiliation: Natl Inst Phys Matter, I-50019 Florence, Italy; European Lab Nonlinear Spect, I-50019 Florence, Italy;
Univ Puerto Rico, RioPiedras, PR 00931 USA;
Univ Twente, Dept Appl Phys, NL-7500 AE Enschede, Netherlands;
Univ Twente, MESA Res Inst, NL-7500 AE
Enschede, Netherlands;
Univ Toulouse 3, Phys Solides Lab, F-31062 Toulouse, France

Abstract: Two-dimensional near-field images of light transmitted through a disordered dielectric structure have been measured for two probe wavelengths. From these data, the 2D spatial dependence of the intensity correlation function, C(Delta(R) over right arrow), has been extracted. We observe that the spatial dependence of C is dominated by a rapidly varying feature determined by the wavelength of the probe light and the average refractive index of the material, as expected by theory. Finally, we deduce the absolute value of the effective refractive index by fitting the theoretical spatial dependence of C to our experimental results.

Journal/Review: PHYSICAL REVIEW LETTERS

Volume: 90 (25)      Pages from: 250801  to: 250801

KeyWords: Disordered media; Intensity correlation; Coherent backscattering; Weak localization; Dielectric materials; Near field scanning optical microscopy; Optical correlation; Photons; Refractive index; Semiconductor lasers; Speckle, Dielectric structures; Light transmission
DOI: 10.1103/PhysRevLett.90.250801

Citations: 48
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