Lineshape of a vertical cavity surface emitting laser

Year: 2002

Authors: Viciani S., Gabrysch M., Marin F., Monti di Sopra F., Moser M., Gulden K.

Autors Affiliation: Dipartimento di Fisica, Università di Firenze, INFM Unità di Firenze and LENS, Via Sansone, 1, 50019 Sesto Fiorentino (FI), Italy;
Avalon Photonics Ltd., 8048 Zurich, Switzerland

Abstract: We report on the experimental study of the lineshape of an air-post GaAs/AlGaAs Vertical-Cavity Surface-Emitting Laser (VCSEL). The signal is obtained by heterodyne with a narrow linewidth extended-cavity laser. This technique allows to fully take into account the entire spectrum of frequency fluctuations. In this way we can distinguish a Lorentzian and a Gaussian contributions to the lineshape, obtaining a clear picture of the dependence of the emission spectrum on the pump current, The study also includes the effects on the laser lineshape of the secondary transverse modes fluctuations. (C) 2002 Elsevier Science B.V. All rights reserved.

Journal/Review: OPTICS COMMUNICATIONS

Volume: 206 (1-3)      Pages from: 89  to: 97

More Information: HPRN-CT-2000-00034. College of Natural Resources, University of California Berkeley, CNR, 98.00444. College of Natural Resources, University of California Berkeley, CNR, PF48. – We want to thank M. Inguscio for encouraging this research. We are also very grateful to G.P. Bava and P. Debernardi for very useful discussion and for communicating the results of their research prior to publication. This work is supported by the PAIS project “Quantum noise reduction in semiconductor optical systems” of the INFM, by the CNR contract no. 98.00444.PF48 (MADESS II) and by the EU network VISTA (contract HPRN-CT-2000-00034) [36] .
KeyWords: Laser noise; Lasers linewidth and lineshape; Vertical cavity surface emitting lasers, Semiconductor lasers; Heterodyning; Natural frequencies; Semiconducting gallium arsenide; Spectrum analysis; Spurious signal noise, Vertical cavity surface emitting lasers (VCSEL), Semiconductor lasers
DOI: 10.1016/S0030-4018(02)01381-0

Citations: 22
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