Elemental mapping and microimaging by x-ray capillary optics

Year: 2008

Authors: Hampai D., Dabagov S.B., Cappuccio G., Longoni A., Frizzi T., Cibin G., Guglielmotti V., Sala M.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Largo E. Fermi, 6,I-50125 Firenze, Italy;
INFN- Laboratori Nazionali di Frascati, Via E. Fermi, 44,I-00040 Frascati (RM), Italy;
MINASlab, Dipartimento di Scienze e Tecnologie Chimiche, Universitá di Roma “Tor Vergata”;
Russian Academy of Sciences–P.N. Lebedev Physical Institute, Leninsky prospect 53, 119991 Moscow, Russia;
Politecnico di Milano, Dip. di Elettronica e Informatica, Via Golgi 40, 20133, Milano, Italy;
Diamond Light Source Ltd., Chilton, Didcot OX11 ODE, UK;
Dipartimento di Scienze della Terra A. Desio, Universitá di Milano, Italy

Abstract: Recently, many experiments have highlighted the advantage of using polycapillary optics for x-ray fluorescence studies. We have developed a special confocal scheme for micro x-ray fluorescence measurements that enables us to obtain not only elemental mapping of the sample but also simultaneously its own x-ray imaging. We have designed the prototype of a compact x-ray spectrometer characterized by a spatial resolution of less than 100 mu m for fluorescence and less than 10 mu m for imaging. A couple of polycapillary lenses in a confocal configuration together with a silicon drift detector allow elemental studies of extended samples (similar to 3 mm) to be performed, while a CCD camera makes it possible to record an image of the same samples with 6 mu m spatial resolution, which is limited only by the pixel size of the camera. By inserting a compound refractive lens between the sample and the CCD camera, we hope to develop an x-ray microscope for more enlarged images of the samples under test. (C) 2008 Optical Society of America

Journal/Review: OPTICS LETTERS

Volume: 33 (23)      Pages from: 2743  to: 2745

KeyWords: silicon drift detectors; xrf;
DOI: 10.1364/OL.33.002743

Citations: 25
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