Second order interferometric autocorrelator for nonlinear optical microscopy

Year: 2004

Authors: Quercioli F., Ghirelli A., Tiribilli B., Vassalli M.

Autors Affiliation: Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy

Journal/Review: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

KeyWords: Nonlinear optical microscopy