Quasi-mosaicity of (311) planes in silicon and its use in a Laue lens with high-focusing power
Year: 2014
Authors: Camattari R., Paternt G., Bellucci V., Guidi V.
Autors Affiliation: Ist Nazl Fis Nucl, Dept Phys & Earth Sci, I-44122 Ferrara, Italy; Univ Ferrara, Natl Inst Opt CNR INO Sensor, I-44122 Ferrara, Italy.
Abstract: (311) curved planes can be exploited for efficiently focus hard X-rays. With this purpose, a self-standing bent crystal was manufactured at the Sensor and Semiconductor Laboratory of Ferrara (Italy). The crystal was designed as an optical component for a X-ray concentrator such as a Laue lens. The curvature of (311) planes was obtained through the quasi-mosaic effect. The diffraction efficiency of the sample was tested at the Institut Laue Langevin of Grenoble (France) by using a collimated monochromatic X-ray beam. This was the first prove of the diffraction properties of (311) quasi-mosaic planes. Diffraction efficiency resulted 35 % with a 182 keV X-ray beam, in agreement with the theoretical expectation. It corresponded to a reflectivity of 33 %. While the chosen orientation is not the most performing lying of planes, it can be used, in addition to smaller-index planes, in order to raise the total effective area of a Laue lens. To quantify it, a Laue lens based on quasi-mosaic silicon and germanium crystals, exploiting (111), (422) and (311) diffracting planes, was achieved and simulated with the LaueGen code.
Journal/Review: EXPERIMENTAL ASTRONOMY (PRINT)
Volume: 38 (3) Pages from: 417 to: 431
More Information: The authors are thankful to INFN for financial support through the LOGOS project. The authors thank Michael Jentschel (Institut Laue-Langevin, Grenoble) for assistance in experimental measurements.KeyWords: Laue lens simulation; Quasi-mosaicity; Grooving method; (311) Bent planesDOI: 10.1007/s10686-014-9429-7Citations: 8data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-11-17References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here