Dynamical Behavior of Two Coupled Two-Stroke Relaxation Oscillators

Year: 2024

Authors: Ducci D., Meucci R., Euzzor S., Ginoux JM., Di Garbo A.

Autors Affiliation: Pisa Univ, Dept Phys, Largo Bruno Pontecorvo 3, I-56127 Pisa, Italy; CNR, Natl Inst Opt, Largo Enrico Fermi 6, I-50125 Florence, Italy; Aix Marseille Univ, Univ Toulon, CNRS, CPT, Marseille, France; CNR, Inst Biophys, Area Ric San Cataldo,Via G Moruzzi 1, I-56124 Pisa, Italy.

Abstract: Starting from [J.-M. Ginoux et al., Torus breakdown in a uni junction memristor, Int. J. Bifurcation Chaos 28(10) (2018) 1850128; J.-M. Ginoux et al., Torus breakdown in a two-stroke relaxation memristor, Chaos Solitons Fractals 153 (2021) 111594], we define a model which describes the dynamical behavior of a class of two-stroke oscillators (i.e., nonlinear oscillators with two distinct phases per cycle). We highlight some properties of the model still not taken into account, like presence of a global bifurcation and bistability for some regions of the parameters space. We then extend the model to study two coupled two-stroke oscillators, where synchrony and anti-synchrony regimes appear as well as transient chaos and intermittency phenomena. We finally compare the theoretical results on synchrony regimes with the corresponding experimental data obtained from a circuit where two relaxation oscillators, based on the Unijunction Transistor (UJT) electronic component, are coupled together. The comparison shows a good qualitative agreement between the experiments and the theoretical results.

Journal/Review: FLUCTUATION AND NOISE LETTERS

Volume: 23 (1)      Pages from:   to:

KeyWords: Two-stroke oscillators; relaxation oscillators; nonlinear oscillators; UJT; chaos; transient chaos; intermittency; nonlinearity; dynamical systems
DOI: 10.1142/S021947752440008X

Citations: 2
data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-11-17
References taken from IsiWeb of Knowledge: (subscribers only)
Connecting to view paper tab on IsiWeb: Click here
Connecting to view citations from IsiWeb: Click here