Quantum and thermal fluctuations in the dynamics of a resistively and capacitively shunted Josephson junction
Year: 2021
Authors: Furutani K., Salasnich L.
Autors Affiliation: Univ Padua, Dipartimento Fis & Astron Galileo Galilei, Via Marzolo 8, I-35131 Padua, Italy; Ist Nazl Fis Nucl INFN, Sez Padova, Via Marzolo 8, I-35131 Padua, Italy; CNR INO, Via Nello Carrara, I-50019 Sesto Fiorentino, Italy.
Abstract: We theoretically investigate the phase and voltage correlation dynamics, which includes both the deterministic contribution and stochastic fluctuations, under a current noise generated by a resistor including thermal and quantum fluctuations in a resistively and capacitively shunted Josephson junction. An external current is found to shift and intensify the deterministic contributions in phase and voltage. In addition to effects of external current, we observe the relaxation of autocorrelation functions of phase and voltage, which includes the variances due to the current noise, to finite values in the long-time limit. In particular, we find that the asymptotic correlations depend on the resistance as a consequence of quantum effects. We also find an earlier decay of coherence at a higher temperature in which thermal fluctuations dominate over quantum ones. These theoretical predictions can be tested in the next future experiments. (c) 2021 American Physical Society
Journal/Review: PHYSICAL REVIEW B
Volume: 104 (1) Pages from: 014519-1 to: 014519-8
More Information: K.F. is supported by a Ph.D. fellowship of the Fondazione Cassa di Risparmio di Padova e Rovigo. This work is partially supported by the BIRD project “Time-dependent density functional theory of quantum atomic mixtures” in the University of Padova.KeyWords: phase-diagram; noise; agitationDOI: 10.1103/PhysRevB.104.014519Citations: 4data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-10-27References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here