Immunity of intersubband polaritons to inhomogeneous broadening
Year: 2017
Authors: Manceau JM., Biasiol G., Tran NL., Carusotto I., Colombelli R.
Autors Affiliation: Univ Paris Saclay, Univ Paris Sud, Ctr Nanosci & Nanotechnol, C2N Orsay,CNRS,UMR 9001, F-91405 Orsay, France; CNR IOM, Lab TASC, Area Sci Pk,SS 14 Km 163-5 Basovizza, I-34149 Trieste, Italy; Univ Trento, BEC Ctr, INO CNR, I-38123 Povo, Italy; Univ Trento, Dipartimento Fis, I-38123 Povo, Italy.
Abstract: We demonstrate that intersubband (ISB) polaritons are robust to inhomogeneous effects originating from the presence of multiple quantum wells (MQWs). In a series of samples that exhibit mid-infrared ISB absorption transitions with broadenings varying by a factor of 5 (from 4 to 20 meV), we observed polariton linewidths always lying in the 4 to 7 meV range only. We experimentally verified the dominantly inhomogeneous origin of the broadening of the ISB transition, and that the linewidth reduction effect of the polariton modes persists up to room-temperature. This immunity to inhomogeneous broadening is a direct consequence of the coupling of the large number of ISB oscillators to a single photonic mode. It is a precious tool to gauge the natural linewidth of the ISB plasmon that is otherwise masked in such MQWs system, and is also beneficial in view of perspective applications such as intersubband polariton lasers.
Journal/Review: PHYSICAL REVIEW B
Volume: 96 (23) Pages from: 235301-1 to: 235301-6
More Information: We thank F. Julien, C. Ciuti, G. C. La Rocca, and S. De Liberato for useful discussions. This work was partly supported by the French RENATECH network. We acknowledge financial support from the European Union FET-Open grant MIR-BOSE 737017.KeyWords: Semiconductor Microcavities; Linewidths; Disorder; LaserDOI: 10.1103/PhysRevB.96.235301Citations: 17data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-11-17References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here