BackAuthor: Ascoli Cesare 1) Measuring the elastic properties of living cells through the analysis of current-displacement curves in scanning ion conductance microscopy in PFLUGERS ARCHIV-EUROPEAN JOURNAL OF PHYSIOLOGYBy: Pellegrino M., Pellegrini M., Orsini P., Tognoni E., Ascoli C., Baschieri P., Dinelli F. Year: 2012 (IF.: 4.866 Cit.: 25 DOI: 10.1007/s00424-012-1127-6)
2) Demonstration of an electrostatic-shielded cantilever in APPLIED PHYSICS LETTERSBy: Pingue P., Piazza V., Baschieri P., Ascoli C., Menozzi C., Alessandrini A., Facci P. Year: 2006 (IF.: 3.977 Cit.: 14 DOI: 10.1063/1.2168247)
3) Imaging of ferroelectric polarization in Pb(Mg1/3Nb2/3)O-3-PbTiO3 crystals by scanning electro-optic microscopy in APPLIED PHYSICS LETTERSBy: Tikhomirov O., Labardi M., Ascoli C., Allegrini M., Lebrun L. Year: 2006 (IF.: 3.977 Cit.: 3 DOI: 10.1063/1.2190907)
4) Scanning probe microscopy as a tool for nanoimprint lithography in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pingue P., Dinelli F., Baschieri P., Ascoli C., Menozzi C., Facci P., Beltram F. Year: 2007 (IF.: 3.934 )
5) Structure and nanomechanical properties of solvent cast stearic acid films in liquid: An atomic force microscopy study in LANGMUIRBy: Cappella B., Baschieri P., Ruffa M., Ascoli C., Relini A., Rolandi R. Year: 1999 (IF.: 2.937 Cit.: 9 DOI: 10.1021/la980736y)
6) Recapitulation of the Roberts syndrome cellular phenotype by inhibition of INCENP, ZWINT-1 and ZW10 genes in GENEBy: Musio A., Mariani T., Montagna C., Zambroni D., Ascoli C., Ried T., Vezzoni P. Year: 2004 (IF.: 2.705 Cit.: 19 DOI: 10.1016/j.gene.2004.01.028)
7) Weak hydrostatic forces in far-scanning ion conductance microscopy used to guide neuronal growth cones in NEUROSCIENCE RESEARCHBy: Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2011 (IF.: 2.250 Cit.: 37 DOI: 10.1016/j.neures.2010.11.009)
8) Scanning electro-optic microscopy of ferroelectric domain structure with a near-field fiber probe in JOURNAL OF APPLIED PHYSICSBy: Tikhomirov O., Labardi M., Ascoli C., Allegrini M. Year: 2011 (IF.: 2.168 Cit.: 3 DOI: 10.1063/1.3656731)
9) Simultaneous micromechanical and electromagnetic detection of electron paramagnetic resonance in JOURNAL OF MAGNETIC RESONANCEBy: Alzetta G., Ascoli C., Baschieri P., Bertolini D., Betti I., De Masi B., Frediani C., Lenci L., Martinelli M., Scalari G. Year: 1999 (IF.: 2.106 Cit.: 9 DOI: 10.1006/jmre.1999.1878)
10) Characterization of tip size and geometry of the pipettes used in scanning ion conductance microscopy in MICRONBy: Tognoni E., Baschieri P., Ascoli C., Pellegrini M., Pellegrino M. Year: 2016 (IF.: 1.980 Cit.: 11 DOI: 10.1016/j.micron.2016.01.002)
11) Comment on “The long range voice coil atomic force microscope” [Rev. Sci. Instrum. 83, 023705 (2012)] in REVIEW OF SCIENTIFIC INSTRUMENTSBy: Mariani T., Ascoli C. Year: 2012 (IF.: 1.602 Cit.: 1 DOI: 10.1063/1.4752146)
12) Bilateral switching of the modulated electrooptic contrast in PLZTN ceramics in SOLID STATE COMMUNICATIONSBy: Tikhomirov O., Labardi M., Ascoli C., Allegrini M., Galassi C. Year: 2006 (IF.: 1.556 Cit.: 2 DOI: 10.1016/j.ssc.2006.02.012)
13) Scanning force images through the ’Milliscope’ – A probe microscope with very wide scan range in JOURNAL OF MICROSCOPYBy: Mariani T., Ascoli C., Baschieri P., Frediani C., Musio A. Year: 2001 (IF.: 1.464 Cit.: 4 DOI: 10.1046/j.1365-2818.2001.00932.x)
14) Monitoring of an atomic force microscope cantilever with a compact disk pickup in REVIEW OF SCIENTIFIC INSTRUMENTSBy: Quercioli F., Tiribilli B., Ascoli C., Baschieri P., Frediani C. Year: 1999 (IF.: 1.293 Cit.: 40 DOI: 10.1063/1.1149969)
15) Integrated SICM-AFM-optical microscope to measure forces due to hydrostatic pressure applied to a pipette in MICRO & NANO LETTERSBy: Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2012 (IF.: 0.845 Cit.: 16 DOI: 10.1049/mnl.2011.0670)
16) Scanning Electrooptic Microscopy of the Relaxor Materials By: Tikhomirov O., Labardi M., Ascoli C., Allegrini M. Year: 2006 (IF.: 0.389 DOI: 10.1080/00150190600889320)
17) Force-Distance Curves by AFM. A powerful technique for Studying Surface interactions in IEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINEBy: Cappella B., Baschieri P., Frediani C., Miccoli P., Ascoli C. Year: 1997 (Cit.: 78 DOI: 10.1109/51.582177)
18) Laser thermal effects on atomic force microscope cantilevers in ULTRAMICROSCOPYBy: Allegrini M., Ascoli C., Baschieri P., Dinelli F., Frediani C., Lio A., Mariani T. Year: 1992 (Cit.: 52 DOI: 10.1016/0304-3991(92)90295-U)
19) Improvements in AFM imaging of the spatial variation of force-distance curves: on line images By: Cappella B., Baschieri P., Frediani C., Miccoli P., Ascoli C. Year: 1997 (Cit.: 31 DOI: 10.1088/0957-4484/8/2/006)
20) Micromechanical detection of magnetic resonance by angular momentum absorption in APPLIED PHYSICS LETTERSBy: Ascoli C., Baschieri P., Frediani C., Lenci L., Martinelli M. Year: 1996 (Cit.: 25 DOI: 10.1063/1.117570)
21) Fabrication of hybrid superconductor-semiconductor nanostructures by integrated UV-AFM lithography in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B, MICROELECTRONICS AND NANOMETER STRUCTURESBy: Pingue P., Lazzarino M., Beltram F., Cecconi C., Baschieri P., Frediani C., Ascoli C. Year: 1997 (Cit.: 19 DOI: 10.1116/1.589547)
22) Scanning probe microscope with interchangeable AFM-FFM and STM heads in NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICSBy: Allegrini M., Arpa E., Ascoli C., Baschieri P., Dinelli F., Frediani C., Labardi M., Lio A., Mariani T., Vanni L. Year: 1993 (Cit.: 16 DOI: 10.1007/BF02456911)
23) Measuring topography and refractive index of channel waveguides with a hybrid AFM-SNOM in JOURNAL OF LIGHTWAVE TECHNOLOGYBy: Mannoni A., Quercioli F., Tiribilli B., Ascoli C., Baschieri P., Frediani C. Year: 1998 (Cit.: 8 DOI: 10.1109/50.661365)
24) Probing Italy: A Scanning Probe Microscopy Storyline in MICRO-SWITZERLANDBy: Dinelli F., Brucale M., Valle F., Ascoli C., Samorm B., Sartore M., Adami M., Galletti R., Prato S., Troian B., Albonetti C. Year: 2023 (Cit.: 2 DOI: 10.3390/micro3020037)
25) Scanning Ion Conductance Microscopy—Morphology and Mechanics in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Tognoni E., Baschieri P., Dinelli F., Ascoli C., Pellegrino M. Year: 2018 26) Evanescent waves in the visible range in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Ascoli C., Allegrini M. Year: 2014 27) Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Ascoli C., Baschieri P., Dinelli F., Year: 2013 ( DOI: 10.1117/12.2021541)
28) Strategies to measure the Young modulus of cells by means of Scanning Ion Conductance Microscopy in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 29) Use of scanning ion conductance microscopy to map
elastic properties of cell membranes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 30) Use of scanning ion conductance microscopy to map elastic properties of cell membranes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 ( DOI: 10.1109/IWBP.2011.5954800)
31) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2010 32) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica utilizzata per la guida dei coni di crescita neuronali in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrini M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2010 33) Una sonda ibrida AFM/SNOM integrata in fibra ottica in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Tiribilli B., Margheri G., Baschieri P., Ascoli C., Menozzi C., Chavan D., Iannuzzi D. Year: 2010 34) “Electrooptic Imaging of Ferroelectric Domains with a Near-Field Fiber Probe”, in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini Year: 2006 35) “Resolution Improvement in Near-Field Optical Microscopy by Application of Surface-Localized Fields: Case of Electro-Optic Modulation”, in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini, Year: 2006 36) “Scanning Electro-Optic Microscopy of Ferroelectrics” in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini, Year: 2005 37) Surface scanning probe microscopy of biomolecules in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Ascoli C Year: 2005 38) A USER-FRIENDLY APPROACH TO NANOLITHOGRAPHY AND NANOMANIPULATION in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pingue P.,Baschieri P.,Ascoli C., Dayez M. Year: 2004 39) Scanning Probe Microscopy in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Ascoli C., Gottardi R. and Petracchi D Year: 2004 40) A Scanning Force Milliscope in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Mariani T., Baschieri P., Frediani C., Ascoli C.
Year: 1998 41) Simultaneous force ad optical tunneling microscopy with 3-D interaction mapping using SI3N4 probes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Mannoni S., Ascoli C., Baschieri P., Frediani C., Quercioli F., Tiribilli B. Year: 1996
