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Author: Ascoli Cesare Category: Abstract 

1) Scanning probe microscopy as a tool for nanoimprint lithography in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Pingue P., Dinelli F., Baschieri P., Ascoli C., Menozzi C., Facci P., Beltram F. Year: 2007 (IF.: 3.934 )

2) Strategies to measure the Young modulus of cells by means of Scanning Ion Conductance Microscopy in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 3) Use of scanning ion conductance microscopy to map
elastic properties of cell membranes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 4) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: Tognoni E., Pellegrino M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2010 5) “Electrooptic Imaging of Ferroelectric Domains with a Near-Field Fiber Probe”, in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini Year: 2006 6) “Resolution Improvement in Near-Field Optical Microscopy by Application of Surface-Localized Fields: Case of Electro-Optic Modulation”, in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini, Year: 2006 7) “Scanning Electro-Optic Microscopy of Ferroelectrics” in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
By: O. Tikhomirov, M. Labardi, C. Ascoli, M. Allegrini, Year: 2005