BackAuthor: Dinelli Franco Category: Conference proceedings 1) Nanometre scale 3D nanomechanical imaging of semiconductor structures from few nm to sub-micrometre depths in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Kolosov O.V., Dinelli F., Robson A., Krier A., Hayne M., Fal\’Ko V.I., Henini M. Year: 2015 (Cit.: 0 DOI: 10.1109/IITC-MAM.2015.7325609)
2) Nanometre scale 3D nanomechanical imaging of semiconductor structures from few nm to sub-micrometre depths in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Kolosov O.V., Dinelli F., Robson A., Krier A., Hayne M., Fal’ko VI., Henini M. Year: 2015 (Cit.: 0)
3) Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Ascoli C., Baschieri P., Dinelli F., Year: 2013 (Cit.: 0 DOI: 10.1117/12.2021541)
4) Seeing the invisible – ultrasonic force microscopy for true subsurface elastic imaging of semiconductor nanostructures with nanoscale resolution in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Kolosov O.V., Dinelli F., Krier A., Henini M., Hayne M., Pinque P. Year: 2012 (Cit.: 1)
5) Mapping nanomechanical phenomena in graphene nanostructures using force modulation and ultrasonic force microscopy in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Kolosov O., Kay N., Robinson B., Rosamond M., Zeze D., Falko V., Dinelli F. Year: 2012 (Cit.: 0)
6) Use of scanning ion conductance microscopy to map elastic properties of cell membranes in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrino M., Orsini P., Pellegrini M., Tognoni E., Baschieri P., Dinelli F., Petracchi D., Ascoli C. Year: 2011 (Cit.: 0 DOI: 10.1109/IWBP.2011.5954800)
7) Scanning Probe Microscopy techniques for the characterization of polymer thin films and composites in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Dinelli F. Year: 2010 (Cit.: 0)
8) Interazione sonda-campione nella microscopia a scansione di conduttanza ionica utilizzata per la guida dei coni di crescita neuronali in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Pellegrini M., Orsini P., Pellegrini M., Baschieri P., Dinelli F., Petracchi D., Tognoni E., Ascoli C. Year: 2010 (Cit.: 0)
9) Focused ion beam as tool for atomic force microscope (AFM) probes sculpturing in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Menozzi C., Calabri L., Facci P., Pingue P., Dinelli F., Baschieri P. Year: 2008 (Cit.: 5 DOI: 10.1088/1742-6596/126/1/012070)
10) Influence of the dielectric and of the active layer doping on the FET mobility in PPV-based devices in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Todescato F., Capelli R., Dinelli F., Murgia M., Camaioni N., Yang M., Muccini M. Year: 2007 (Cit.: 0)
11) Characterization of oxide gas barrier films in JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSBy: Henry B.M., Dinelli F., Zhao K.-Y., Erlat A.G., Grovenor C.R.M., Briggs G.A.D., Kumar R.S., Howson R.P. Year: 1999 (Cit.: 0 DOI: NODOI)