Stress-optic modulator: A novel device for high sensitivity linear birefringence measurements
Anno: 2001
Autori: Brandi F., Polacco E., Ruoso G.
Affiliazione autori: INFN, Sezione di Pisa, via Livornese 582/a, 56010 S Piero a Grado (PI), Italy; Dipartimento di Fisica, Piazza Torricelli 1, 56100 Pisa, Italy; Dipartimento di Fisica \’Galileo Galilei\’, INFN, via Marzolo 8, 35131 Padova, Italy; Department of Physics and Astronomy, Laser Centre, Vrije Universiteit, De Boelelaan 1081, 1081 HV Amsterdam, Netherlands; INFN-Laboratori Nazionali di Legnaro, via Romea 4, 35020 Legnaro, Italy
Abstract: In this paper we present a device, called the stress-optic modulator (SOM), that allows us to perform high sensitivity measurements of linear birefringence with low frequency signal. The SOM can be used as a polarization modulator in a heterodyne detection scheme to measure the ellipticity induced on a linearly polarized laser beam. Its operation makes use of the strain produced on a glass window by two blocked PZTs, thus enabling a careful control of the stress and of the anisotropy induced on the isotropic glass. A sensitivity of 3 x 10(-8) Hz(-1/2) for an ellipticity signal at the frequency of 1 Hz is obtained. For long term operation of the device a drawback arises from the drift of the spurious birefringences present in the optical system. Through the use of an active feedback system this quasi-static anisotropy can be compensated, enabling much longer integration times without degradation of the sensitivity.
Giornale/Rivista: MEASUREMENT SCIENCE & TECHNOLOGY
Volume: 12 (9) Da Pagina: 1503 A: 1508
Parole chiavi: Birefringence; Elasto-optical effects; Eellipsometers; Stress-optic modulators (SOM)
DOI: 10.1088/0957-0233/12/9/317Citazioni: 30dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-04-28Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui