Nanoscale rippling on polymer surfaces induced by AFM manipulation
Autori: D’Acunto M., Dinelli F., Pingue P.
Affiliazione autori: Istituto Struttura della Materia, ISM-CNR, via Fosso del Cavaliere 100, 00133 Rome; Istituto di Scienza e Tecnologie dell’Informazione, ISTI-CNR, via Moruzzi, 1, 56124, Pisa, Italy; Istituto Nazionale di Ottica, INO-CNR, via Moruzzi 1, 56124, Pisa, Italy; Laboratorio NEST, Scuola Normale Superiore and Istituto Nanoscienze-CNR, Piazza San Silvestro 12, 56127 Pisa, Italy;
Abstract: Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored and studied. Due to the possibility of varying and controlling various parameters, this phenomenon has recently gained a great interest for some technological applications. The advent of AFM cantilevers with integrated heaters has promoted further advances in the field. An alternative method to heating up the tip is based on solvent-assisted viscoplastic deformations, where the ripples develop upon the application of a relatively low force to a solvent-rich film. An ensemble of AFM-based procedures can thus produce nanoripples on polymeric surfaces quickly, efficiently, and with an unprecedented order and control. However, even if nanorippling has been observed in various distinct modes and many theoretical models have been since proposed, a full understanding of this phenomenon is still far from being achieved. This review aims at summarizing the current state of the art in the perspective of achieving control over the rippling process on polymers at a nanoscale level.
Giornale/Rivista: BEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume: 6 (1) Da Pagina: 2278 A: 2289
Parole chiavi: Atomic force microscopy (AFM); Films; Nanomanipulationation; Nanomechanics;; PolymersDOI: 10.3762/bjnano.6.234Citazioni: 8dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2022-06-26Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui