Risultati scientifici

Medium-term stability effects on a fused silica planarity standard

Anno: 2006

Autori: Vannoni M., Molesini G.

Affiliazione autori: CNR – Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy

Titolo Convegno: Conference on Precision Electromagnetic Measurements (CPEM)
Luogo: Torino

Parole chiavi: planarity; Interferometry;

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