Risultati scientifici

Monitoring the optical thickness of transparency films by homodyne interferometry

Anno: 1996

Autori: Greco V., Trivi M., Molesini G.

Affiliazione autori: Istituto Nazionale di Ottica, Largo e. Fermi 6, 50125 Firenze, Italy

Titolo Convegno: Applied Optics and Opto-Electronics 1996
Luogo: Reading

Parole chiavi: Homodyne interferometry; optical metrology;

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